Widefield SERS for High‐Throughput Nanoparticle Screening

Surface-enhanced Raman scattering (SERS) imaging is a powerful technology with unprecedent potential for ultrasensitive chemical analysis. Point-by-point scanning and often excessively long spectral acquisition-times hamper the broad exploitation of full analytical SERS. Here, we introduce large-scale SERS particle screening (LSSPS), multiplexed widefield approach to characterization, which 500–1000 times faster than typical confocal implementations. Beyond its higher throughput, LSSPS simultaneously quantifies both sample's Rayleigh directly quantify fraction SERS-active particles allows an unprecedented correlation activity size. .